The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Jul. 13, 2022
Applicant:

Vergason Technology, Inc., Van Etten, NY (US);

Inventors:

Joshua B. Soper, Candor, NY (US);

Gregory A. Pilgrim, Ithaca, NY (US);

Assignee:

VERGASON TECHNOLOGY, INC., Van Etten, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/14 (2006.01); C23C 14/54 (2006.01); C23C 14/58 (2006.01);
U.S. Cl.
CPC ...
C23C 14/14 (2013.01); C23C 14/542 (2013.01); C23C 14/58 (2013.01); Y10T 428/24942 (2015.01); Y10T 428/24975 (2015.01);
Abstract

A multi-layer PVD film stack contains a first layer higher index of refraction metal followed by a second layer semi-transparent lower index of refraction metal. The thickness of the second layer dictates the reflectivity of the second layer material. The second layer not only increases the reflectivity of the first layer, but it also decreases the reflectivity lost when the PVD film is topcoat lacquered. However, lacquering decreases the reflectivity of the higher index first layer (generally n value >1.9 at 632 nm). Using a higher refractive index metal as an opaque first layer followed by a semi-transparent second layer of a lower refractive index metal minimizes the darkening of the metal(s) after lacquer topcoat due to the lower refractive index of the second layer, which is in contact with the lacquer.


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