The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Dec. 16, 2020
Applicant:

Hitachi Building Systems Co., Ltd., Tokyo, JP;

Inventors:

Toshiaki Matsumoto, Tokyo, JP;

Masaru Kawasaki, Tokyo, JP;

Yanzhou Song, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B66B 5/00 (2006.01);
U.S. Cl.
CPC ...
B66B 5/0087 (2013.01);
Abstract

The present invention measures a sound generated from mechanical equipment, specifies an abnormal component from measurement data, indicates, if a plurality of specified components exists, an additional measurement position, and compares a plurality of measured data, to specify an arrangement position of the abnormal component.


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Matsumoto, Toshiaki. (2025). Inspection device and inspection method for elevating machine (U.S. Patent No. 12428265). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12428265

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