The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Aug. 23, 2022
Varex Imaging Corporation, Salt Lake City, UT (US);
Michael Stamm, Schaffhausen, CH;
David T. Nisius, Des Plaines, IL (US);
Daniel Shedlock, Knoxville, TN (US);
Josh M. Star-Lack, Palo Alto, CA (US);
Gregory C. Andrews, West Jordan, UT (US);
Matthias Ehrat, Hettlingen, CH;
VAREX IMAGING CORPORATION, Salt Lake City, UT (US);
Abstract
An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-ray source in respective controlled inspection positions. A detection mechanism is adapted to acquire respective images of the multiple objects in the respective controlled inspection positions. The detection mechanism includes one or more detectors arranged circumferentially around a central axis. At least one positioning mechanism is adapted to move the multiple objects into and out of the respective controlled inspection positions.