The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Sep. 02, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sang Yun Park, Hwaseong-si, KR;

Jae Min Kang, Seoul, KR;

Yong Joo Kwon, Yongin-si, KR;

Youn Ho Kim, Hwaseong-si, KR;

Seung Woo Noh, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/021 (2006.01); A61B 5/00 (2006.01); A61B 5/022 (2006.01); A61B 5/024 (2006.01); A61B 5/352 (2021.01);
U.S. Cl.
CPC ...
A61B 5/02116 (2013.01); A61B 5/02241 (2013.01); A61B 5/02416 (2013.01); A61B 5/02438 (2013.01); A61B 5/681 (2013.01); A61B 5/6885 (2013.01); A61B 5/7278 (2013.01); A61B 5/02225 (2013.01); A61B 5/02427 (2013.01); A61B 5/352 (2021.01); A61B 5/6814 (2013.01); A61B 5/7203 (2013.01); A61B 2562/0247 (2013.01);
Abstract

An apparatus for measuring bio-information in a non-invasive manner includes: a pulse wave sensor configured to measure a plurality of pulse wave signals having different wavelengths from an object; a contact pressure sensor configured to measure contact pressure of the object while the plurality of pulse wave signals are measured; and a processor configured to obtain an oscillometric waveform based on the contact pressure and the plurality of pulse wave signals having the different wavelengths, and obtain bio-information based on the oscillometric waveform.


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