The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Aug. 03, 2020
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for collecting biometric measurement data of an eye on the basis of different measurement modalities, allowing for physiologically correct, representative, and robust biometric measurement data. In the method, the measurement data for individual measurement variables and the dynamic behavior of the eye are recorded continuously at the highest possible repetition rate over the measurement time. The individual phases of the dynamics of the eye which define the limits of the phase for stable vision are analyzed on the basis of the measurement values, and only the measurement data for the individual measurement variables are output which have been detected during the phase for stable vision. Although the proposed method is provided for collecting biometric measurement data in preparation for a cataract operation, the method can also be applied to other areas of ophthalmology to generate error-free measurement data or recordings of the eye.