The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Apr. 25, 2022
Applicant:

Adeia Guides Inc., San Jose, CA (US);

Inventor:

Zhu Li, Overland Park, KS (US);

Assignee:

Adeia Guides Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/122 (2018.01); H04N 13/161 (2018.01); H04N 13/388 (2018.01);
U.S. Cl.
CPC ...
H04N 13/122 (2018.05); H04N 13/161 (2018.05); H04N 13/388 (2018.05);
Abstract

Systems, methods and apparatuses are described herein for training a machine learning model to accept as input synthetic aperture image (SAI) training data for a three-dimensional (3D) display, the 3D display comprising a plurality of layers. The machine learning model may be trained to output respective pixel representations of the SAI training data for each of the plurality of layers of the 3D display. The provided systems, methods and apparatuses may access image data, input the image data to the trained machine learning model, and determine, using the trained machine learning model, respective pixel representations of the input image data for each of the plurality of layers of the 3D display. The provided systems, methods and apparatuses may encode the respective pixel representations of the input image data, and transmit, for display at the 3D display, the encoded respective pixel representations of the input image data.


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