The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Sep. 14, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Rubayet Shafin, Allen, TX (US);
Ahmed Atef Ibrahim Ibrahim, Plano, TX (US);
Peshal Nayak, Plano, TX (US);
Boon Loong Ng, Plano, TX (US);
Vishnu Vardhan Ratnam, Plano, TX (US);
Junsu Choi, Siheung-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Methods and apparatuses for facilitating enhanced channel quality measurements on links of a multi-link device (MLD) in a wireless local area network. A non-access point (AP) MLD comprises stations (STAs), each comprising a transceiver configured to form a link with a corresponding AP affiliated with an AP MLD and receive, over the link, a channel sounding signal. The non-AP MLD further comprises a processor configured to determine, based on the channel sounding signal received at a first time over a first one of the links, an initial channel quality indicator (CQI) value for the first link, and determine, based on interference caused on the first link by a second one of the links at a second time, a CQI offset value for the first link relative to the initial CQI value. The transceivers are configured to transmit, to the AP MLD, the initial CQI value and the CQI offset value.