The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Apr. 01, 2020
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Muhammad Majid Butt, Palaiseau, FR;

Veronique Capdevielle, Magny les Hameaux, FR;

Anil Rao, Redmond, WA (US);

Afef Feki, Sceaux, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 76/19 (2018.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
H04W 76/19 (2018.02); H04W 64/00 (2013.01);
Abstract

A method and apparatus () for beam failure management for a user equipment (UE) () are described. A beam failure instance counter (BFI_counter) is determined, that is indicative of a number of consecutive beam failure instances occurred at the UE (), at a time instance. A location of the UE () is determined at the time instance. A beam failure probability factor is determined, based at least on the location of the UE () at the time instance and the BFI_counter. The beam failure probability factor is indicative of a probability of occurrence of a beam failure at the location of the UE (), after a plurality of further time instances. Further, the beam failure probability factor is compared with a beam failure threshold probability (beamFailureThresholdProb). Thereafter, a beam failure is declared if the beam failure probability factor is higher than the beamFailureThresholdProb.


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