The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Apr. 09, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jihwan Hyun, Suwon-si, KR;

Chanki Kim, Jeonju-si, KR;

Jaewha Kim, Daejeon, KR;

Jongseon No, Seoul, KR;

Junghwan Choi, Suwon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/15 (2006.01); G06F 11/10 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
H03M 13/159 (2013.01); G06F 11/1044 (2013.01); H03M 13/611 (2013.01);
Abstract

An error correction code (ECC) decoder includes a syndrome generator and a burst error corrector. The syndrome generator generates global syndrome data and local syndrome data using input data and a parity check matrix based on a constacyclic code. The burst error corrector corrects a correctable error included in the input data using the global syndrome data and the local syndrome data. The input data includes a plurality of data bits arranged along a first direction and a second direction. The ECC decoder simultaneously corrects a single burst error and a multi-bit error. The single burst error occurs on two or more symbols arranged along the first direction in the input data, and each symbol includes two or more data bits. The multi-bit error randomly occurs on two or more data bits in the input data.


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