The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Jan. 14, 2025
Institute of Agricultural Resources and Regional Planning, Chinese Academy of Agricultural Sciences, Beijing, CN;
Hongwei Zhao, Beijing, CN;
Jia Liu, Beijing, CN;
Wenbin Wu, Beijing, CN;
Lei Wang, Beijing, CN;
Ruoyun Xing, Beijing, CN;
Abstract
The present invention belongs to the technical field of crop mapping based on remote-sensing images, and relates to a method and system for crop mapping across large regions with low sample dependence. The method includes: acquiring remote sensing data, ground sample data, meteorological data, soil data, establishing geographically divided crop planting regions; establishing key growth period model libraries corresponding to individual crop regions; constructing machine learning models based on a plurality of machine learning algorithms, to obtain machine learning crop extraction models; selecting an optimal machine learning crop extraction model; acquiring a spatial crop distribution base map; performing product correction based on the disaster information; and acquiring a regional crop map using a target crop extraction model adapted for the disaster response. The present invention, achieve high-accuracy and large-scale crop mapping, and reduce the crop sample dependence of crop mapping.