The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Oct. 20, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
From an input image, a candidate area in which an object exists is acquired. Furthermore, a confidence score indicating a possibility that the object exists and a class probability are acquired. An overlap ratio between candidate areas is calculated for each combination of two arbitrary detection results, and a combination of detection results with an overlap ratio equal to or larger than a threshold value is output as an overlap-detected group. A candidate area used as a representative area is determined from detection results included in the overlap-detected group based on a confidence score. Each class index is calculated based on the overlap ratio with respect to the representative area, and a class with the highest class index is determined as the class of the representative area.