The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Aug. 17, 2021
Ankon Technologies Co., Ltd, Wuhan, CN;
ANKON TECHNOLOGIES CO., LTD, Wuhan, CN;
ANX IP HOLDING PTE. LTD., Singapore, SG;
Abstract
A method and system for determining quality of a capsule endoscope image. The method comprises: acquiring a first group of images of a standard color card that are photographed by a capsule endoscope in a non-magnetic-field environment and a second group of images of the standard color card that are photographed by the capsule endoscope in a magnetic field environment; calculating a peak signal-to-noise ratio of each color region of the standard color card in the non-magnetic-field environment and a peak signal-to-noise ratio of each color region of the standard color card in the magnetic field environment according to the acquired first group of images and the acquired second group of images; and determining, according to the calculated peak signal-to-noise ratios, whether a magnetic field affects the quality of a capsule endoscope image. The effect of the magnetic field on the quality of an image can be effectively determined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile