The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Feb. 28, 2023
Seiko Epson Corporation, Tokyo, JP;
Mitsuhiro Yamashita, Matsumoto, JP;
Takahiro Kamada, Matsumoto, JP;
Naoki Hagihara, Shiojiri, JP;
Takuya Ono, Shiojiri, JP;
Yuko Yamamoto, Shiojiri, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
Prepare a learning model that has been trained to output similarity for each defect species by machine learning using a teacher image that is an image containing a defect occurring during printing and that is associated with a defect species in advance. Then, a target image is prepared for inspection by acquiring an image of printed matter that has been printed. By using the learning model with respect to this target image, the similarity of the defect present in the target image to a known defect species is acquired, and this similarity is used to discriminate the defect present in the target image as at least one of the known defect species. When updating the learning model based on this discrimination result, the learning model is made to perform machine learning for a defect species that is different from the discriminated defect species or that is associated with an unknown defect.