The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Nov. 19, 2021
Applicant:

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Chung-Yu Wu, New Taipei, TW;

Chin-Pin Kuo, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/01 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01N 21/01 (2013.01); G01N 21/8851 (2013.01); G01N 2201/061 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A method for selecting a light source for illuminating defects, an electronic device, and a non-transitory storage medium are provided. The method includes acquire grayscale images of an object with a known defect and generates a pseudo-hyperspectral image cube based on the grayscale images, so that algorithms related to hyperspectral images can analyze the grayscale images collected under different light sources. A most effective or target light source can be automatically and quickly determined from the plurality of light sources, improving an efficiency of light source selection.


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