The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Dec. 18, 2023
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0637 (2023.01); G06F 40/103 (2020.01); G06F 40/289 (2020.01);
U.S. Cl.
CPC ...
G06Q 10/06375 (2013.01); G06F 40/103 (2020.01); G06F 40/289 (2020.01);
Abstract

This disclosure relates generally to impact analysis and, more particularly, to generation of impact analysis specification document for a change request. The existing state-of-art techniques for impact analysis for a change request are mostly manual, and further most of the research on impact analysis is based on source code analysis and does not address the impact of the CR at multi-granular levels. The disclosed techniques perform a fine-grained impact analysis of the CR at multi-granular levels. The fine-grained impact analysis at multi-granular includes identifying a set of impacted specification elements, a set of impacted processes, and a set of impacted features based on several steps including generating a contextual specification model and extracting a plurality of key-phrases.


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