The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jun. 15, 2023
Applicant:

Jabil Inc., St. Petersburg, FL (US);

Inventors:

Mudit Bajaj, St. Petersburg, FL (US);

Andrew Joyner, St. Petersburg, FL (US);

Ross Valentine, St. Petersburg, FL (US);

Erin Morris, St. Petersburg, FL (US);

Paul Docherty, St. Petersburg, FL (US);

Ancha Koteswararao, St. Petersburg, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0635 (2023.01); G06F 16/904 (2019.01); G06N 20/00 (2019.01); G06Q 10/0631 (2023.01); G06Q 10/0637 (2023.01); G06Q 10/08 (2024.01); G06Q 10/087 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/0635 (2013.01); G06F 16/904 (2019.01); G06N 20/00 (2019.01); G06Q 10/063114 (2013.01); G06Q 10/06315 (2013.01); G06Q 10/0637 (2013.01); G06Q 10/06375 (2013.01); G06Q 10/08 (2013.01); G06Q 10/087 (2013.01);
Abstract

Apparatus, system and method for supply chain management (SCM) system processing. A SCM operating platform is operatively coupled to SCM modules for collecting, storing, distributing and processing SCM data to determine statistical opportunities and risk in a SCM hierarchy. SCM risk processing may be utilized to determine risk values that are dependent upon SCM attributes. Multiple SCM risk processing results may be produced for further drill-down by a user. SCM network nodes, their relation and status may further be produced for fast and efficient status determination.


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