The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Aug. 26, 2020
Applicants:

Sony Corporation, Tokyo, JP;

Sony Corporation of America, New York, NY (US);

Inventors:

Piyush Khandelwal, Austin, TX (US);

James Macglashan, Riverside, RI (US);

Peter Wurman, Acton, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/045 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/045 (2023.01);
Abstract

Reinforcement learning methods can use actor-critic networks where (1) additional laboratory-only state information is used to train a policy that much act without this additional laboratory-only information in a production setting; and (2) complex resource-demanding policies are distilled into a less-demanding policy that can be more easily run at production with limited computational resources. The production actor network can be optimized using a frozen version of a large critic network, previously trained with a large actor network. Aspects of these methods can leverage actor-critic methods in which the critic network models the action value function, as opposed to the state value function.


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