The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

May. 08, 2020
Applicant:

Coventor, Inc., Cary, NC (US);

Inventors:

William J. Egan, Framingham, MA (US);

Anshuman Kunwar, Jamaica Plain, MA (US);

Kenneth B. Greiner, Arlington, MA (US);

David M. Fried, South Salem, NY (US);

Assignee:

Coventor, Inc., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 111/08 (2020.01); G06F 119/22 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 2111/08 (2020.01); G06F 2119/22 (2020.01);
Abstract

A virtual fabrication environment for semiconductor device fabrication that includes an analytics module for performing process window optimization is discussed.


Find Patent Forward Citations

Egan, William. (2025). System and method for process window optimization in a virtual semiconductor device fabrication environment (U.S. Patent No. 12423486). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12423486

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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