The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jun. 16, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Bao Zhang, Beijing, CN;

Xi Qing Zhang, Beijing, CN;

Jin Hong Fu, Beijing, CN;

He Huang, Beijing, CN;

Shi Chong Ma, Beijing, CN;

Jia Yu, Beijing, CN;

Mu Chen, Beijing, CN;

Hui Zhang, Shanghai, CN;

Ran Ren, Shanghai, CN;

Xing Xing Shen, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/242 (2019.01); G06F 16/23 (2019.01); G06F 16/2457 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/244 (2019.01); G06F 16/2358 (2019.01); G06F 16/2457 (2019.01); G06F 16/258 (2019.01);
Abstract

A method, computer system, and a computer program for monitoring synchronization and aggregation are provided. The method may include receiving a plurality of metrics and identifying a plurality of metadata associated with the plurality of metrics. The method may further include calculating a hash value of the plurality of metadata based on the plurality of metrics. The method may further include detecting at least one modification to the plurality of metadata based on the hash value and updating the plurality of metrics based on the at least one modification in which the plurality of metrics are displayed in a self-adapting metric diagram.


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