The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jun. 29, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Ofir Ezrielev, Beer Sheva, IL;

Hanna Yehuda, Acton, MA (US);

Kristen Jeanne Walsh, Austin, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01);
Abstract

Methods and systems for curating data from data sources are disclosed. Data may be curated from various data sources before being stored in a repository and/or supplied to downstream consumers. The downstream consumers may rely on the trustworthiness of the curated data to provide desired computer-implemented services. During the data curation process, collected data may undergo quality control processes such as anomaly detection that may identify anomalies in the data. The identified anomalies may indicate the presence of poisoned data that, if provided to downstream consumers, may negatively impact the computer-implemented services facilitated by the downstream consumers. When poisoned data is detected among the data, portions of the data affected by the poisoned data (e.g., the poisoned portions) may be identified using an optimization process. The poisoned data may be used to identify and initiate performance of an action set that may reduce the impact of the poisoned data.


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