The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Dec. 21, 2021
Ajou University Industry-academic Cooperation Foundation, Suwon-si, KR;
Jung Won Lee, Seoul, KR;
Ye Seul Park, Incheon, KR;
Dong Yeon Yoo, Suwon-si, KR;
Yang Gon Kim, Siheung-si, KR;
Su Bin Bae, Suwon-si, KR;
AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION, Suwon-si, KR;
Abstract
The present invention relates to a method and device for diagnosing a defect of a collaborative robot, the method comprising the steps in which: an electronic device generates a sensing data structure for managing sensing data collected from at least one collaborative robot; the electronic device generates an operation data structure for managing operation data associated with the operation of the collaborate robot; the electronic device generates a malfunction data structure for managing malfunction data of a point in which the severity of the operation equals to or is higher than a threshold; and the electronic device stores data collected from the at least one collaborative robot in accordance with the structures. Application to other embodiments is also possible.