The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Aug. 27, 2021
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Trevor Thomas Chapman, Allen, TX (US);
Stephen B Loe, Dallas, TX (US);
Malgorzata Anna Brothers, Plano, TX (US);
Matt Thomas Nicolosi, Delaware, OH (US);
Michel Georges Stella, Dallas, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01); G06F 21/74 (2013.01);
U.S. Cl.
CPC ...
G06F 11/368 (2013.01); G06F 11/3684 (2013.01); G06F 21/74 (2013.01);
Abstract
A method for test configuration on a first math assistance device is provided that includes receiving a test code by the first math assistance device, wherein the test code includes one or more functionality restrictions, and entering secure test mode on the first math assistance device with the one or more functionality restrictions.