The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Feb. 20, 2024
Lemon Inc., Grand Cayman, KY;
Peng Xu, Los Angeles, CA (US);
Fei Liu, Los Angeles, CA (US);
Kyoungryun Bae, Los Angeles, CA (US);
Jinhyuk Kim, Los Angeles, CA (US);
Prathamesh Amritkar, Los Angeles, CA (US);
Dengcheng Zhu, Los Angeles, CA (US);
Wei Tang, Los Angeles, CA (US);
Sheng Qiu, Los Angeles, CA (US);
Lemon Inc., Grand Cayman, KY;
Abstract
A computing system for verifying data integrity is provided, including a host device comprising a memory controller, and a storage device. The memory controller receives original data blocks, each having an associated initial CRC value. The memory controller then segments and recombines the data blocks into logic blocks. The storage device is configured to write the logic blocks to its non-volatile memory of the storage device in the write operation, calculate a new logic block (LB) CRC value for each logic block, and calculate a combined LB CRC value. After the write operation, the memory controller combines duplicated copies of a given CRC value for each of the original data blocks, then combines them together to calculate a combined segments CRC value, and compares the combined segments CRC value to the combined LB CRC value. When the combined CRC values match, a verification response is generated verifying data integrity.