The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Mar. 21, 2024
Applicant:

Kioxia Corporation, Tokyo, JP;

Inventors:

Avi Steiner, Tel Aviv, IL;

Alex Britva, Tel Aviv, IL;

Liran Kost, Tel Aviv, IL;

Eyal Nitzan, Tel Aviv, IL;

Hanan Weingarten, Tel Aviv, IL;

Yasuhiko Kurosawa, Kanagawa, JP;

Yasuyuki Ushijima, Tokyo, JP;

Assignee:

KIOXIA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01);
Abstract

One or more processors of a system may determine one or more program parameters of a plurality of rows of cells of a non-volatile memory, determine a first threshold of a first parameter of each row based on the one or more program parameters of the plurality of rows, determine, by changing a programming time of each row, a set of parameters of each row that causes the first parameter not to cross the first threshold, determine a second threshold of a second parameter of each row based on production statistics of a plurality of dies as a result of mass production, adjust the programming time of each row to cause the second parameter not to cross the second threshold, and program data to a first row of the plurality of rows using the set of parameters of the first row and the adjusted programming time of the first row.


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