The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

May. 25, 2021
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventor:

Bart Schouwenaars-Harms, Henley-on-Thames, GB;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G05B 13/02 (2006.01); H04L 41/08 (2022.01); H04L 41/0803 (2022.01); H04L 41/0859 (2022.01);
U.S. Cl.
CPC ...
G05B 13/042 (2013.01); G05B 13/0265 (2013.01); H04L 41/08 (2013.01); H04L 41/0803 (2013.01); H04L 41/0859 (2013.01);
Abstract

Machine-level metrics for machines of a processing line, as well as latent metrics for results of the processing line, are obtained for the current time period. Machine configuration setting values for the machines during the current time period, as well as at the earlier time period are also obtained. Updates to current configuration setting values of the machines are determined based upon analysis of the machine-level metrics, the process-level metrics for the current time period, the latent metrics for the earlier time period, and the machine configuration setting values for the current and earlier time periods (e.g., the metrics and configuration values may be input to one or more machine learning models used to determine the updates to current configuration setting values for the individual machines). The current values may be changed to the updated values via an automated process or the updates presented as a recommendation report.


Find Patent Forward Citations

Schouwenaars-Harms, Bart. (2025). Individual machine configuration based on overall process performance and latent metrics (U.S. Patent No. 12422792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12422792

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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