The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jul. 03, 2023
Applicant:

Cubixel Co., Ltd., Seoul, KR;

Inventor:

Tae Geun Kim, Seoul, KR;

Assignee:

CUBIXEL CO., LTD, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/22 (2006.01); G02B 26/10 (2006.01); G02B 27/28 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0443 (2013.01); G02B 26/101 (2013.01); G02B 27/283 (2013.01); G02B 27/286 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/0463 (2013.01); G03H 2222/31 (2013.01); G03H 2222/45 (2013.01); G03H 2223/20 (2013.01); G03H 2223/22 (2013.01); G03H 2223/24 (2013.01); G03H 2225/32 (2013.01); G03H 2226/02 (2013.01);
Abstract

An optical scanning holography system includes a polarization-sensitive lens configured to receive a linearly polarized beam and generate a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a first polarizer configured to pass only a beam component therethrough in a predetermined polarization direction among components of the generated first and second spherical waves, a scanning unit configured to scan an object by using an interference beam generated between the first and second spherical waves passing through the first polarizer, and a first photodetector configured to detect a beam reflected from the object.


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