The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Jan. 09, 2020
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Christian Schumann, Lich, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An oblique plane microscope includes an optical imaging system configured to form an image of an object. The optical imaging system includes a telescope system with an optical zoom system, which is adjustable for adapting a magnification of the telescope system to a ratio between two refractive indices, one of which being associated with an object side of the telescope system and the other being associated with an image side of the telescope system. The oblique plane microscope further includes a control unit. The control unit is configured to evaluate an image quality of the image formed by the optical imaging system and to adjust the optical zoom system based on the evaluation.