The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Dec. 05, 2022
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Markus Schechter, Wetzlar, DE;

Tobias Hessler, Wetzlar, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G01N 21/64 (2006.01); G02B 7/36 (2021.01); H04N 23/50 (2023.01); H04N 23/667 (2023.01); H04N 23/67 (2023.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G01N 21/6458 (2013.01); G02B 7/36 (2013.01); H04N 23/50 (2023.01); H04N 23/67 (2023.01); H04N 23/667 (2023.01);
Abstract

A method for controlling microscopic imaging of a microscope includes providing a microscope control arrangement configured for receiving a focusing request and for receiving sample information on a sample to be imaged, wherein the microscope control arrangement activates, upon receipt of a focusing request and after having received the sample information, a predefined focusing setting depending on the sample information received for controlling focusing of the microscope for microscopic imaging of the sample.


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Schechter, Markus. (2025). Method for controlling microscopic imaging and corresponding microscope control arrangement and microscope (U.S. Patent No. 12422659). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12422659

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