The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
May. 26, 2021
Ventana Medical Systems, Inc., Tucson, AZ (US);
Martin Philip Gouch, Hertfordshire, GB;
Louise Joanne Collins, Hertfordshire, GB;
William Hawes, Hertfordshire, GB;
Ventana Medical Systems, Inc., Tucson, AZ (US);
Abstract
A method is provided for operating a microscope scanner. A first imaging scan is performed of one or more area(s) of interest, AOI, on a target including a sample. This involves moving a detector array relative to the target along an image scan path and acquiring an image of the target at each of a plurality of locations along the image scan path. Focus control data is generated during the imaging scan by calculating a focus merit value at each said location along the image scan path. The focal height of the detector array is then adjusted along the image scan path based on the focus merit values. The efficacy of the first imaging scan is analysed using the focus control data and a change to one or more scanning parameters from the first imaging scan is determined, for the performance of a second imaging scan, based on this analysis.