The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Aug. 16, 2023
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Björn Kreisler, Hausen, DE;

Edgar Göderer, Forchheim, DE;

Stefan Wirth, Erlangen, DE;

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/244 (2013.01); A61B 6/00 (2013.01); A61B 6/5282 (2013.01);
Abstract

An X-ray imager having an X-ray source, a semiconductor detector, and a processor. On a rear side of the semiconductor detector facing away from the front side, in each of a plurality of imaging regions of the semiconductor detector, at least one imaging electrode is arranged and a plurality of detectors each contact at least one of the imaging electrodes in order to acquire first measurement values relating to X-ray signals of the imaging electrodes. The processor is configured to establish an image dataset dependent upon the first measurement values. At least one additional electrode is arranged on the rear side of the semiconductor detector outside the imaging regions. At least one current sensor contacts the additional electrode or at least one of the additional electrodes in each case to acquire the current flow by way of the second measurement values relating to the at least one additional electrode.


Find Patent Forward Citations

Loading…