The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Apr. 27, 2023
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Yicheng Zhou, Shanghai, CN;

Xiaodong Li, Shanghai, CN;

Kangcheng Xu, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/374 (2019.01); G01R 31/3842 (2019.01); G01R 35/00 (2006.01); H03M 1/12 (2006.01); H02J 7/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/374 (2019.01); G01R 31/3842 (2019.01); G01R 35/005 (2013.01); H03M 1/1245 (2013.01); H02J 7/0048 (2020.01);
Abstract

Various examples disclosed herein relate to current sensing via current sensing circuitry, and more particularly, to calibrating current sensing circuitry to dynamically detect current ranges across a load. In an example embodiment, a microcontroller unit (MCU) is provided herein that includes a processor and current sensing circuitry coupled to the processor. The current sensing circuitry of the MCU is configured to measure voltages associated with a load. The processor of the MCU is configured to obtain the measured voltages from the current sensing circuitry, identify a temperature drift of the current sensing circuitry that exceeds a threshold value, update parameters with which to determine a current associated with the load based on the temperature drift, and determine the current associated with the load based on the updated parameters and the measured voltages.


Find Patent Forward Citations

Loading…