The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Jun. 20, 2023
Amazon Technologies, Inc., Seattle, WA (US);
Tom Kolan, Haifa, IL;
Adi Habusha, Alonei Abba, IL;
Nicolas Worms, Haifa, IL;
Ilan Wachtel, Mazkeret Batya, IL;
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Hardware errors can be detected by generating a plurality of test templates to perform testing on an integrated circuit (IC) device. A set of random tests can be generated corresponding to the plurality of test templates. The set of random tests can be executed on the IC device for multiple passes, and the results of the multiple passes can be compared to detect the hardware error in the IC device. The set of random tests can be generated as a binary image for execution on the IC device. The IC device may include multiple processing cores, and executing the multiple passes may include changing logical role of each processing core between subsequent passes. The set of random tests can be executed in a bare-metal mode, or at an application level of the IC device.