The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Sep. 29, 2023
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Tanmay Neema, Bangalore, IN;

Kanak Das, Bangalore, IN;

Rajavelu Thinakaran, Bangalore, IN;

Gautam Nandi, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H03F 3/45 (2006.01); H03M 1/66 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2879 (2013.01); G01R 31/2889 (2013.01); H03F 3/45475 (2013.01); H03M 1/662 (2013.01); H03F 2200/261 (2013.01);
Abstract

The techniques and circuits, described herein, include solutions for error compensation in source measurement units (SMUs). An example SMU is capable of both sourcing current to a device under test (DUT) and measuring current through the DUT. An SMU may include a sensing resistor coupled in series with the DUT. A voltage across the sensing resistor may be measured by a current sensing amplifier in order to determine the output current through the DUT. In practice, the resistance of the sensing resistor may vary depending on manufacturing tolerances, etc. A gain of the current sensing amplifier may be calibrated in order to compensate for sensing resistor variance, which increases the accuracy with which current to the DUT can be sourced and measured.


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