The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Mar. 09, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Makoto Nogami, Tokyo, JP;

Shinya Matsuoka, Tokyo, JP;

Daisuke Ebihara, Tokyo, JP;

Yuichiro Hashimoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0098 (2013.01); G01N 2035/00356 (2013.01); G01N 2035/00534 (2013.01); G01N 2035/0446 (2013.01);
Abstract

A pretreatment method of an automatic analyzer, in which pretreatments of a plurality of substances to be measured can be performed by a series of treatments using a plurality of magnetic beads that can bind to the plurality of substances to be measured, is achieved. In the pretreatment method of an automatic analyzer, a magnetic bead is added to a sample containing a substance to be measured, the substance to be measured is bound to the magnetic bead, the magnetic bead is extracted from the sample, and the substance to be measured is separated from the magnetic bead by an eluate. A plurality of magnetic beads that bind to a plurality of types of substances to be measured are added to a sample, and the plurality of types of substances to be measured are extracted from the magnetic bead by an eluate.


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