The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jun. 01, 2023
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Research & Business Foundation Sungkyunkwan University, Suwon-si, KR;

Inventors:

Ilhwan Kim, Suwon-si, KR;

Changhyeon Kim, Suwon-si, KR;

Kangyoon Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/02 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/022 (2013.01); G01N 29/4436 (2013.01); G01N 2291/02408 (2013.01);
Abstract

A dust mass measurement device includes a sensing channel configured to generate a sensing clock signal, a reference channel configured to generate a reference clock signal, a counter configured to generate a first output signal based on the sensing clock signal, and generate a second output signal based on the reference clock signal, and a controller configured to calculate a frequency difference between the sensing clock signal and the reference clock signal based on a difference value between the first output signal and the second output signal, which are received from the counter, and measure a mass of dust based on the calculated frequency difference.


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