The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Feb. 23, 2023
Netzsch-gerätebau Gmbh, Selb, DE;
Ekkehard Füglein, Selb, DE;
Georg Neumann, Schönwald, DE;
NETZSCH-Gerätebau GmbH, Selb, DE;
Abstract
A thermal analysis of samples and proposes a device for a thermal analysis of a sample, having: a sample chamber for receiving a sample crucible including a crucible cover attached thereto, in the interior of which a sample to be analyzed is located, wherein the sample chamber has a chamber opening for introducing the sample crucible into the sample chamber; a temperature control mechanism for controlling the temperature of the sample chamber; a measuring mechanism for measuring a temperature of the sample and one or several further measured variables; a gas conveying mechanism for creating a gas atmosphere in the sample chamber; a chamber cover, which can be attached to the chamber opening of the sample chamber; and a piercing mechanism equipped with a needle, which is suitable to pierce a hole into the crucible cover of the sample crucible by means of the needle when the sample crucible is received in the sample chamber and when the chamber cover is attached to the chamber opening. A corresponding method for a thermal analysis of a sample, a sample crucible including a crucible cover, as well as a covering/piercing unit are further proposed as part of the invention.