The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Sep. 17, 2021
Applicant:
Hand Held Products, Inc., Charlotte, NC (US);
Inventors:
Chen Feng, Mount Laurel, NJ (US);
Suresh Venkatarayalu, Waxhaw, NC (US);
Robert Timothy Kester, Friendswood, TX (US);
Assignee:
Hand Held Products, Inc., Charlotte, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); B01F 33/302 (2022.01); B01F 33/3033 (2022.01); B01L 7/00 (2006.01); B01L 9/00 (2006.01); B23D 63/00 (2006.01); B29C 37/00 (2006.01); B65G 47/80 (2006.01); B82Y 20/00 (2011.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01); C12M 1/34 (2006.01); C12M 3/06 (2006.01); C12N 1/14 (2006.01); C12N 1/20 (2006.01); C12Q 1/02 (2006.01); C12Q 1/6806 (2018.01); C12Q 1/6844 (2018.01); C12Q 1/6848 (2018.01); C12Q 1/686 (2018.01); C23C 2/00 (2006.01); G01N 15/10 (2024.01); G01N 15/14 (2024.01); G01N 15/1433 (2024.01); G01N 21/29 (2006.01); G01N 21/41 (2006.01); G01N 21/45 (2006.01); G01N 21/65 (2006.01); G01N 33/543 (2006.01); G01N 33/574 (2006.01); G01N 33/58 (2006.01); G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); B23D 63/008 (2013.01); C23C 2/51 (2022.08); G02B 6/4204 (2013.01); A61H 2201/5007 (2013.01); B01D 2313/70 (2022.08); B01D 2313/701 (2022.08); B29C 2037/903 (2013.01); C02F 2209/006 (2013.01); G01N 2021/4166 (2013.01); G01N 2201/0846 (2013.01);
Abstract
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.