The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

May. 17, 2023
Applicant:

Repligen Corporation, Waltham, MA (US);

Inventors:

Matthew Muller, Cranford, NJ (US);

Richard Hall, Iii, Bernardsville, NJ (US);

Yusheng Zhang, Stewartsville, NJ (US);

Peter Halatin, Howell, NJ (US);

Assignee:

Repligen Corporation, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/33 (2006.01);
U.S. Cl.
CPC ...
G01N 21/33 (2013.01); G01N 2201/062 (2013.01);
Abstract

A system may include a light source, to generate a probe signal, comprising incident radiation; an optical probe, to direct the incident radiation through a fluid sample; a motor, to move the optical probe along a probe axis, to change a path length of the incident radiation through the fluid sample; and a detector, to receive the incident radiation as attenuated radiation after passing through the fluid sample. The system may include a control system, arranged to: initiate an absorbance measurement by directing movement of the optical probe along the probe axis; direct the light source to emit the incident radiation; and automatically adjust at least one measurement parameter of a set of measurement parameters for the sample measurement, based upon a slope parameter m, wherein m is derived from a rate of change in an intensity of the attenuated radiation with a change in the path length.


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