The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Oct. 05, 2023
Applicant:

The Catholic University of Korea Industry-academic Cooperation Foundation, Seoul, KR;

Inventor:

Hosik Hwang, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/04 (2006.01); G01M 11/02 (2006.01); A61F 2/16 (2006.01);
U.S. Cl.
CPC ...
G01M 11/04 (2013.01); G01M 11/0214 (2013.01); A61F 2/1618 (2013.01);
Abstract

An optical bench tester for a multifocal intraocular lens is disclosed. An optical bench tester for a multifocal intraocular lens according to an aspect of the present disclosure may include a resolution test chart; a plurality of optical systems that refract images irradiated from the resolution test chart; an electrically driven liquid lens unit provided at the rear of the optical system to control the refraction of light passing through; a model eye having a multifocal intraocular lens on which light transmitting through the electrically driven liquid lens unit is incident; a camera that captures light transmitted through the model eye; and a control unit that controls the electrically driven liquid lens unit to control the refractive index of the electrically driven liquid lens unit, and calculates a defocus curve by analyzing images captured through the camera.


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