The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Jan. 08, 2024
Triple Win Technology(shenzhen) Co. Ltd., Shenzhen, CN;
Hsuan-Wei Ho, New Taipei, TW;
TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD., Shenzhen, CN;
Abstract
Disclosed in the present application is a three-dimensional (3D) contour measurement system. The 3D contour measurement system includes a light source unit, an image acquisition unit, and a control device. The light source unit emits light beam, the light source modulation unit modulates the light beam into a structured light with a preset frequency. The image acquisition unit acquires a stripe image of the object. The control device processes the stripe image to obtain a spectral image, obtains a first phase corresponding to a first structured light, a second phase corresponding to the second structured light, and an equivalent phase corresponding to the structured light based on the spectral region, and obtains a contour height of the object based on the first phase, the second phase, and the equivalent phase.