The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Sep. 22, 2021
Applicant:

National University Corporation Shizuoka University, Shizuoka, JP;

Inventor:

Masatsugu Niwayama, Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02055 (2022.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
G01B 9/02069 (2013.01); G01N 21/359 (2013.01);
Abstract

In a measurement target model representing a measurement target, this measurement sensitivity calculation device uses, as measurement sensitivity, an optical path length difference between a first optical path length indicating the length of an optical path through which light emitted from a light emitter to the measurement target travels before being received by a first light receiver spaced apart by a first distance from the light emitter and a second optical path length indicating the length of an optical path through which light emitted from the light emitter travels before being received by a second light receiver spaced apart by a second distance from the light emitter, calculates the measurement sensitivity for each depth of the measurement target, and outputs the measurement sensitivity calculated for each depth of the measurement target.


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