The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Aug. 19, 2022
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventor:

Daichi Kawauchi, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); B08B 13/00 (2006.01); B23Q 23/00 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G01B 5/008 (2013.01); B08B 13/00 (2013.01); B23Q 23/00 (2013.01); G05B 19/401 (2013.01); B23Q 2717/00 (2013.01); G05B 2219/31304 (2013.01);
Abstract

A method for calibrating a positional relation between a main spindle and a contact tool sensor attached to a table in a machine tool. The method includes: mounting a reference tool on the main spindle and obtaining measurement position coordinates as respective tool sensor measurement values, the measurement position coordinates being of a distal end of the reference tool in at least two different measurement regions on an upper surface of the contact tool sensor; outputting predetermined difference values based on the respective tool sensor measurement values; determining an abnormality when the difference values are compared with preliminarily set acceptable values and at least one of the difference values are out of the acceptable values; and calibrating a positional relation between the main spindle and the contact tool sensor based on the respective tool sensor measurement values when the abnormality is not determined at the determining of abnormality.


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