The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
May. 08, 2024
Applicant:
Schlumberger Technology Corporation, Sugar Land, TX (US);
Inventors:
Makito Katayama, Cheltenham, GB;
Edward Richards, Cheltenham, GB;
Assignee:
Schlumberger Technology Corporation, Sugar Land, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 47/0228 (2012.01); E21B 7/06 (2006.01); E21B 44/00 (2006.01); E21B 47/18 (2012.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
E21B 47/0228 (2020.05); E21B 7/06 (2013.01); E21B 44/005 (2013.01); E21B 47/18 (2013.01); G01R 33/0017 (2013.01);
Abstract
A method for making axial magnetic field measurements in a downhole tool includes evaluating axial magnetic field measurements to determine a magnetic interference offset and removing the magnetic interference offset to obtain compensated axial magnetic field measurements.
Katayama, Makito. (2025). Interference compensated axial magnetometer measurements (U.S. Patent No. 12421842). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12421842
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile