The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Sep. 17, 2021
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Alejandro Antonio Becker, Stockdorf, DE;

Benjamin Paul Foerg, Munich, DE;

Tobias Christian Roeder, Munich, DE;

Uwe Stute, Neustadt am Rübenberge, DE;

Assignee:

CORNING INCORPORATED, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03B 33/07 (2006.01); B23K 26/362 (2014.01); B23K 26/402 (2014.01); C03B 33/02 (2006.01);
U.S. Cl.
CPC ...
C03B 33/074 (2013.01); B23K 26/362 (2013.01); B23K 26/402 (2013.01); C03B 33/0222 (2013.01);
Abstract

A method of laser processing a coated substrate having a coating later disposed on a transparent workpiece that includes determining an optical characteristic of the coating layer and selecting a beam path for a pulsed laser beam based on the optical characteristic. The beam path is selected a polarization-adjusting beam path and a frequency-adjusting beam path. The method also includes directing the pulsed laser beam down the selected beam path to form a modified pulsed laser beam and directing the modified pulsed laser beam into the transparent workpiece, where the modified pulsed laser beam forms a laser beam focal line that induces absorption in the transparent workpiece to produce a defect in the transparent workpiece. The laser beam focal line includes a wavelength λ, a spot size w, and a Rayleigh range Zthat is greater than where Fis a dimensionless divergence factor.


Find Patent Forward Citations

Loading…