The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Nov. 16, 2020
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Srikanth Reddy Tenkayyagaari, Bangalore, IN;

Sharath Sridhar Aramanekoppa, Bangalore, IN;

Megha Navalgund, Bangalore, IN;

Steven T. Slusher, West Chester, OH (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/153 (2017.01); B29C 64/268 (2017.01); B29C 64/282 (2017.01); B29C 64/286 (2017.01); B29C 64/393 (2017.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/153 (2017.08); B29C 64/268 (2017.08); B29C 64/282 (2017.08); B29C 64/286 (2017.08); B29C 64/393 (2017.08); B33Y 50/02 (2014.12); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12);
Abstract

An additive manufacturing system may include an additive manufacturing machine and a control system. The additive manufacturing machine may include one or more irradiation devices respectively including a beam source configured to emit an energy beam, an optical assembly that has one or more optical elements configured to focus the energy beam emitted by the beam source, a beam source sensor configured to determine a beam source sensor value from a source measurement beam representative of the energy beam prior to the energy beam passing through one or more optical elements of the optical assembly, and an optics sensor configured to determine an optics sensor value from an optics measurement beam representative of the energy beam downstream from the one or more optical elements of the optical assembly. The control system may include an irradiation control module configured to provide one or more control commands to the additive manufacturing machine based at least in part on the beam source sensor value and/or based at least in part on the optics sensor value.


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