The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Aug. 01, 2022
Applicant:
Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;
Inventors:
Assignee:
SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/03 (2006.01); A61B 6/58 (2024.01); G01M 1/36 (2006.01); A61B 6/40 (2024.01); A61B 6/42 (2024.01);
U.S. Cl.
CPC ...
A61B 6/035 (2013.01); A61B 6/03 (2013.01); A61B 6/4435 (2013.01); A61B 6/586 (2013.01); G01M 1/36 (2013.01); A61B 6/032 (2013.01); A61B 6/037 (2013.01); A61B 6/4035 (2013.01); A61B 6/42 (2013.01); A61B 6/447 (2013.01); A61B 6/583 (2013.01);
Abstract
The present application discloses a method for detecting an abnormity in a ray source in a CT system, comprising obtaining scanning data obtained from at least two scans that are performed by a medical device, the medical device including a ray source configured to generate a plurality of rays and a detector configured to detect the plurality of rays; determining, based on a difference of the scanning data, a status characteristic index of the ray source; and determining whether abnormity exists in the ray source based on the status characteristic index.