The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Oct. 28, 2019
Applicant:
Olympus Corporation, Tokyo, JP;
Inventors:
Makoto Kitamura, Hachioji, JP;
Katsuyoshi Taniguchi, Hino, JP;
Hirokazu Godo, Hachioji, JP;
Takashi Kono, Hachioji, JP;
Toshiya Kamiyama, Tama, JP;
Yamato Kanda, Hino, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/06 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 1/000094 (2022.02); A61B 1/000096 (2022.02); A61B 1/00045 (2013.01); A61B 1/0655 (2022.02); G06T 7/0012 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/30096 (2013.01); G06T 2207/30204 (2013.01);
Abstract
An endoscope diagnosis support system includes a processor. The processor performs detection of an anomaly candidate area from an endoscope image obtained by performing image pickup of an inside of a subject to obtain a detection result, and generates a display image in which an indicator indicating detection of the anomaly candidate area is arranged in a periphery portion of the endoscope image in accordance with the detection result.