The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Jan. 12, 2023
Applicant:

Mediatek Inc., Hsinchu, TW;

Inventor:

Hsuan-Li Lin, Hsinchu, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 7/185 (2006.01); H04W 84/06 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 7/18519 (2013.01); H04W 84/06 (2013.01);
Abstract

Various solutions for satellite access network (SAN) or non-terrestrial network (NTN) measurement within overlapping gaps with respect to user equipment and network apparatus in mobile communications are described. An apparatus may receive configurations of a first measurement gap and a second measurement gap. The apparatus may determine whether the first measurement gap and the second measurement gap are non-fully overlapping or fully overlapping. The apparatus may perform measurements within the first measurement gap and the second measurement gap according to a priority in an event that the first measurement gap and the second measurement gap are non-fully overlapping. The apparatus may perform measurements within an extended measurement period in an event that the first measurement gap and the second measurement gap are fully overlapping.


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