The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2025
Filed:
Jan. 16, 2024
Applicant:
Leia Inc., Menlo Park, CA (US);
Inventors:
David A. Fattal, Mountain View, CA (US);
Selim Cayligil, New York City, NY (US);
Assignee:
LEIA Inc., Menlo Park, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/282 (2018.01); H04N 13/271 (2018.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
H04N 13/282 (2018.05); H04N 13/271 (2018.05); H04N 23/90 (2023.01);
Abstract
Systems and methods are directed to a camera system configured to capture a multiview image of an object along an arc. Each camera in the camera system may correspond to a common field of view. In addition, a computing system coupled to the camera system may calculate a target camera baseline based on a first value and a second value, and dynamically adjust an inter-camera capture distance to match the target camera baseline. The first value may indicate the common field of view and the second value may indicate a distance between the camera system and the object.