The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Jan. 29, 2024
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Sunyoung Park, Yongin-si, KR;

Kyongtae Park, Yongin-si, KR;

Youngnam Yun, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/21 (2006.01); G06T 5/60 (2024.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
H04N 5/21 (2013.01); G06T 5/60 (2024.01); G06T 5/70 (2024.01);
Abstract

A method of inspecting image quality includes receiving a non-moire image generated by a simulator and a moire image generated by the simulator based on the non-moire image, training a moire removal deep learning model for converting the moire image into the non-moire image, from which a moire is removed, using the non-moire image and the moire image, inputting an evaluation image generated by capturing an image displayed on a first display region by an imaging device into the moire removal deep learning model, and removing the moire from the evaluation image through the moire removal deep learning model when the evaluation image includes the moire.


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